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ID:55981
Title: Silicon Nitride Membrane Windows, TEM Analysis, X-ray Microscopy, Spectroscopy - http://www.norcada.com
Pagerank:4
Description:Nitride membrane windows from Norcada provide quality support films for TEM analysis, x-ray microscopy, and IR or UV spectroscopy. Low stress silicon membranes can be used for cell windows, specimen support frames, microscope grids and more.
Category:Science and Technology: Nanotechnology
Link Owner:Bryan Smith
Date Added:June 16, 2008 10:05:26 AM
Number Hits:0
 
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